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农业生物技术学报  2026, Vol. 34 Issue (5): 944-954    DOI: 10.3969/j.issn.1674-7968.2026.05.003
Special Subject: Advances in Wheat Biotechnology Current Issue | Archive | Adv Search |
Genetic Analysis and Gene Mapping of the Black Awn Trait in Wheat (Triticum aestivum)
LI Jun-Mei1,2, CHEN Tian-Tian2, WAN Wen-Tao2, WANG Ling2, WEI Lu-Yang3, BIE Tong-De2, ZHAO Ren-Hui2,*, FANG Zheng-Wu1,*
1 College of Agriculture, Yangtze University, Jingzhou 434025, China;
2 Lixiahe Institute of Agriculture Sciences/Key Laboratory of Wheat Biology and Genetic Improvement on Low & Middle Yangtze River Valley Wheat Region (Ministry of Agriculture and Rural Affairs), Yangzhou 225007, China;
3 State Key Laboratory of Crop Genetics and Germplasm Enhancement, Nanjing Agricultural University, Nanjing 210095, China
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