小麦株高全基因组关联分析与候选基因预测

doi:10.3969/j.issn.1674-7968.2024.02.002

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Abstract Plant height (PH) is one of the important agronomic traits in wheat (Triticum aestivum) and is highly correlated with wheat yield. In order to further illustrate the genetic basis of wheat PH, 132 wheat cultivars (lines) were phenotyped under 4 environmental conditions in this study, and genome-wide association analysis (GWAS) of PH was performed based on the mixed liner model (MLM) using a wheat 35K single nucleotide polymorphism (SNP) assay. The results showed that the phenotypic variation of wheat PH was significantly affected by environment and was significantly correlated with the environment, with a broad-sense heritability (h²_B) of 0.60. A total of 22 SNPs significantly associated with PH (P≤0.001) were identified in this study, among which 7 SNPs were identified in 2 or 3 environments, which were stably associated SNPs and distributed on chromosomes 1A, 1B, 1D, 2D, and 4A. One to 3 stably associated SNPs identified on each chromosome, and a single stably associated SNP could explain 9.15%~15.07% of the phenotypic variation. 4 stably associated SNPs overlapped with reported QTLs for PH, and the remaining 3 stably associated SNPs were new loci probably. 265 genes in the 1 Mb interval upstream and downstream of the stably associated loci were analyzed for functional homology in rice (Oryza sativa), and 7 candidate genes were screened for possible effects on PH development. This study may provide new markers and genetic resources for wheat PH improvement.

Key words： Wheat Plant height SNP Genome-wide association analysis (GWAS) Candidate gene

Received: 12 December 2022

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S512.1

Corresponding Authors: *yangdl@gsau.edu.cn

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	Articles by authors
	CHE Zhuo
	WANG Peng
	TIAN Tian
	ZHANG Pei-Pei
	CHEN Tao
	LIU Yuan
	YANG De-Long

Cite this article:

CHE Zhuo,WANG Peng,TIAN Tian, et al. Genome-wide Association Study and Candidate Gene Prediction for Plant Height in Wheat (Triticum aestivum)[J]. 农业生物技术学报, 2024, 32(2): 259-272.

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https://journal05.magtech.org.cn/Jwk_ny/EN/10.3969/j.issn.1674-7968.2024.02.002 OR https://journal05.magtech.org.cn/Jwk_ny/EN/Y2024/V32/I2/259

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