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小麦优异品系遗传构成的简单重复序列(SSR)分析
李小军1,李淦1,董娜1,冯素伟1,姜小苓2,张自阳1,茹振钢1
1. 河南科技学院小麦中心
2. 胡铁柱
Genetic Analysis of Excellent Wheat Breeding Lines Based on Simple Repeat Sequence(SSR) Markers
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摘要 为了探讨优良品种形成的遗传学基础,本研究利用简单重复序列(SSR)标记分析了近期育成的3个丰产小麦(Triticum aestivum L.)品系(百农金光588、百农AK58-18和百农T5)及其姊妹系(百农0487和百农高光3709)的遗传构成。结果表明,2个杂交组合(周麦18/百农AK58和周麦16/温麦8号//百农160)中亲本对不同姊妹系的遗传贡献率均具有较大差异,其中百农AK58对百农金光588、百农AK58-18和百农0487的遗传贡献率分别为51.2%、57.0%和54.0%,高于亲本周麦18的贡献率;百农160对百农高光3709和百农T5的遗传贡献率分别为41.9%和36.4%,高于另外2个亲本(周麦16和温麦8号)的贡献率。在A、B、D基因组及21对染色体上,衍生后代对不同亲本遗传物质的继承率也表现丰富的多样性。百农金光588、百农AK58-18和百农T5分别具有109、36和55个不同于其他姊妹系的SSR特异位点,分别形成了11、3和3个特异染色体区段。这些基因组区段上存在许多与产量和抗病等重要农艺性状相关的基因和QTL,对提高小麦丰产性可能起了重要作用。
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李小军
李淦
董娜
冯素伟
姜小苓
张自阳
茹振钢
关键词 小麦产量姊妹系遗传分析SSR    
Abstract:To investigate the genetic basis of excellent wheat (Triticum aestivum L.) cultivar, three high-yield breeding lines (Bainongjinguang 588, BainongAK 58-18 and Bainong T5) and their sib lines (Bainong 0487 and Bainonggaoguang 3709) were evaluated using SSR markers in this study. Among the 5 breeding lines, Bainongjinguang 588, BainongAK 58-18 and Bainong T5 had high yield potential and disease resistance. These accessions were evaluated using 701 SSR markers distributing across the whole genome of wheat for their effective utilization in future. The result indicated that the genetic contribution from parents to different sib lines in either of the two crossing combinations were various. The total rates of genetic contribution from Bainong AK58 to Bainongjinguang 588, BainongAK 58-18 and Bainong 0487 were 51.2%, 57.0% and 54.0% separately, which were higher than that from Zhoumai 18 (48.8%, 43.0% and 46.0%, respectively). The total rates of genetic contribution from Bainong 160 to Bainonggaoguang 3709 and Bainong T5 were 41.9% and 36.4% separately, which were higher than that from Zhoumai 16 (27.5% and 29.5%, respectively) and Wenmai 8 (30.6% and 34.1%, respectively). Similarly,the rates of genetic information inherited from the parents to their derivatives were also unbalanced on either genomic level or chromosomal level. On genomic level, BainongAK 58-18 and Bainong 0487 from the crossing combination "Zhoumai 18/Bainong AK58" inherited nearly equal genetic component (53.1% and 53.8%, respectively) from their parent Zhoumai18 on A genome. The rate of genetic information inherited from Zhoumai 18 was 52.6% for Bainongjinguang 588, which was higher than that for Bainong AK 58-18 and Bainong 0487 (26.6% and 36.4%, respectively) obviously on B genome, whereas Bainongjingguang 588 and BainongAK 58-18 inherited nearly equal genetic component (49.1% and 48.1%, respectively) from Zhoumai 18 on D genome. Among 21 chromosomes of wheat, the rates of genetic information inherited from Zhoumai 18 for Bainongjinguang 588, BainongAK 58-18 and Bainong 0487 varied from 9.1% to 100%, from 0 to 100% and from 0 to 75.0%, respectively. Similar result could be observed in Bainonggaoguang 3709 and Bainong T5 from the crossing combination "Zhoumai 16/Wenmai 8//Bainong 160". This indicated that the same combination can produce very different varieties during the breeding of wheat. Furthermore, Bainongjinguang 588 had 109 specific SSR loci compared to other 2 sib lines (BainongAK 58-18 and Bainong 0487), which formed 11 specific chromosomal regions. Whereas BainongAK 58-18 had 36 specific SSR loci compared to its sib lines (Bainongjinguang 588 and Bainong 0487), which formed 3 specific chromosomal regions. Bainong T5 had 55 specific SSR loci compared to its sib line (Bainonggaoguang 3709), which also formed 3 specific chromosomal regions. Most of these observed chromosomal regions above are located with genes and QTL associated with agronomic traits such as yield and resistance to disease, which play an important role in yield components of wheat.
Key wordsWheat    Yield    Sib line    Genetic analysis    SSR marker
收稿日期: 2011-11-24     
通讯作者: 茹振钢   
引用本文:   
李小军1,李淦1,董娜1,冯素伟1,姜小苓2,张自阳1,茹振钢1. 小麦优异品系遗传构成的简单重复序列(SSR)分析[J]. , 2012, 20(3): 235-245.
, , , , , ,. Genetic Analysis of Excellent Wheat Breeding Lines Based on Simple Repeat Sequence(SSR) Markers. , 2012, 20(3): 235-245.
链接本文:  
http://journal05.magtech.org.cn/Jwk_ny/CN/     或     http://journal05.magtech.org.cn/Jwk_ny/CN/Y2012/V20/I3/235
 
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