Genetic Diversity Analysis of Aphid- resistant Wheat (Triticum aestivum) and Correlation Analysis Between SSR Markers and Resistance to the English Grain Aphid (Sitobion avenae)
Abstract：English grain aphid (EGA) (Sitobion avenae) is one of the main pests affecting wheat (Triticum aestivum) production in China. Total 54 wheat varieties showed similar resistance to EGA at both seedling and adult plant stages were used as experimental population in this study. The wheat population was analyzed with 99 wheat genome-wide simple sequence repeat (SSR) markers to ascertain the genetic diversity and identify SSR markers associated with EGA resistance. The results indicated that 1 038 alleles were detected and the average number of alleles per locus was 10.48 with a range from 2 to 30. The polymorphism information content (PIC) values ranged from 0.178 6 to 0.973 8, with an average of 0.717 8. Cluster analysis revealed that 2 clusters were identified based on the Nei's genetic distances in the 54 accessions examined. Most varieties with similar geographical origins or resistance to EGA were clustered into the same sub-groups. There were 16 SSR markers associated with EGA resistance through general linear model (GLM) program, and the rates of explanation on the phenotype of related markers ranged from 0.221 9 to 0.556 7. There were 4 SSR markers associated with EGA resistance with the rates of explanation ranging from 0.029 5 to 0.063 3 through mixed linear model (MLM) program. These markers distributed on 14 arms of 11 chromosomes. The genetic diversity and the resistant alleles identification provide basic information on wheat resistance to aphid in breeding and molecular assisted breeding.
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