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Analysis of Key Genome Regions Related Yield Characters of Shuhui527, an Elite Rice Backbone Parent
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Abstract  As one of the backbone parents of hybrid rice breeding at present, Shuhui 527(Oryza sativa) has many merits, such as high general combining ability, strong heterosis of hybrid combination, and many derivative R-lines. In order to clarify the genetic composition and the key genome regions related yield characters of Shuhui 527, the heredity and the entire genome of Shuhui 527 were researched in this study. The results showed that seed-setting rate, filled grain number per panicle, grain number per panicle and panicles were possibly derived from the pedigree of IR24-Shuhui527; the weight of a thousand seeds, plant weight and panicles were possibly derived from the pedigree of Gui630-R1318-Shuhui 527. The genomic map of Shuhui 527 and its related ancestral parents were constructed by scanning the entire genome with 1050 SSR primers, the results revealed that (1) the shared fragments of all varieties (i.e. none polymorphic fragments) accounted for 62.94%; (2) putative multi-originated fragments (polymorphic marker was unable to identify its origin) accounted for approximately 17.53%; (3) in the breeding process of Shuhui 527, R1318 had contributed 13.68% fragments, Fu36-2 had contributed 0.53% fragments, and IR24 had contributed 1.32% fragments; (4) Shuhui 527 had contributed 4% of itself fragments. The results indicated that the key genome regions of Shuhui 527 is initially determined, and some influencing output candidate QTL position spots of key fragments are found according to the analysis of the results of reported yield QTLs. The present study will benifit to the core parent development and supper hybid rice breeding.
Key wordsRice (Oryza sativa L.);Backbone parental;SSR;Origination map     
Received: 24 July 2010     
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NULL. Analysis of Key Genome Regions Related Yield Characters of Shuhui527, an Elite Rice Backbone Parent[J]. , 2011, 19(3): 393-406.
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http://journal05.magtech.org.cn/Jwk_ny/EN/     OR     http://journal05.magtech.org.cn/Jwk_ny/EN/Y2011/V19/I3/393
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